DIAGNOSING DEVICE AND METHOD OF LAYER STRURCURE INCLUDING VARIOUS MATERIAL OF INNER LAYER

摘要

The present invention relates to an internal diagnosing device for a layered structure, which is to diagnose internal defects in a layered structure forming an inner layer by placing a different material in the inner side of an outer layer. The internal diagnosing device for a layered structure comprises: an ultrasonic scanner which is formed to move in the outer layer, transmits ultrasonic waves to the layered structure, and receives the reflected ultrasonic waves while moving in the outer layer; a tap tester which is installed at one side of the ultrasonic scanner and hits the outer layer at regular intervals according to the movement of the ultrasonic scanner in order to measure a contact time with the outer layer; and a defect detecting unit which is connected with the ultrasonic scanner and the tap tester, and detects internal defects in an interest area formed of a specific material among materials forming the inner layer based on ultrasonic signals received by the ultrasonic scanner and the measurement results of the tap tester.