MEMORY MODULE AND MEMORY TEST SYSTEM FOR TESTING THE SAME

摘要

A memory module and a memory test system for testing the same are disclosed. The memory module according to an embodiment of the present invention may include a plurality of ranks and a test control unit wherein the test control unit can be set into a rank parallel test mode. The test control unit set into the rank parallel test mode can activate selected signals which correspond to the ranks simultaneously. The memory test system according to an embodiment of the present invention can test the memory module by recognizing the ranks of the memory module as one rank. [Reference numerals] (AA) No; (BB) Yes; (S01) Power supply; (S02) Rank parallel test mode?; (S03) Control a memory controller in order for a memory module to start the rank parallel test mode; (S04) Recognize the number of ranks included in the memory module as one; (S05,S07) Initialize a system; (S06) Execute a memory module test program