发明名称 |
INCIDENT ILLUMINATION APPARATUS FOR A MICROSCOPE WITH PLANAR LIGHT SOURCE |
摘要 |
The invention relates to an incident illumination apparatus for a microscope for observing a sample (1) in the microscope (10), with a planar light source (100) for incident illumination of the sample (1), wherein the planar light source (100) comprises a plate-shaped optical waveguide with a lower interface (111), an upper interface and at least one side face as well as at least one illumination means, which is arranged in such a way that it radiates light into the optical waveguide via at least one side face serving as light-entry face such that said light propagates in the optical waveguide due to total internal reflection, wherein the total internal reflection is interfered with in a defined manner by an element adjoining a contact face on the lower interface of the optical waveguide in such a way that there is decoupling of light on the upper interface of the optical waveguide. |
申请公布号 |
WO2014020163(A1) |
申请公布日期 |
2014.02.06 |
申请号 |
WO2013EP66316 |
申请日期 |
2013.08.02 |
申请人 |
LEICA MICROSYSTEMS (SCHWEIZ) AG |
发明人 |
PAULUS, ROBERT;SCHNITZLER, HARALD;ZUEST, RETO |
分类号 |
G02B21/08;F21V8/00 |
主分类号 |
G02B21/08 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|