发明名称 INCIDENT ILLUMINATION APPARATUS FOR A MICROSCOPE WITH PLANAR LIGHT SOURCE
摘要 The invention relates to an incident illumination apparatus for a microscope for observing a sample (1) in the microscope (10), with a planar light source (100) for incident illumination of the sample (1), wherein the planar light source (100) comprises a plate-shaped optical waveguide with a lower interface (111), an upper interface and at least one side face as well as at least one illumination means, which is arranged in such a way that it radiates light into the optical waveguide via at least one side face serving as light-entry face such that said light propagates in the optical waveguide due to total internal reflection, wherein the total internal reflection is interfered with in a defined manner by an element adjoining a contact face on the lower interface of the optical waveguide in such a way that there is decoupling of light on the upper interface of the optical waveguide.
申请公布号 WO2014020163(A1) 申请公布日期 2014.02.06
申请号 WO2013EP66316 申请日期 2013.08.02
申请人 LEICA MICROSYSTEMS (SCHWEIZ) AG 发明人 PAULUS, ROBERT;SCHNITZLER, HARALD;ZUEST, RETO
分类号 G02B21/08;F21V8/00 主分类号 G02B21/08
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