发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 In writing, a first write operation to a first memory cell is executed; and a second write operation for providing a first threshold-voltage distribution to a second memory cell adjacent to the first one, is executed. The first threshold voltage distribution is a lowest threshold-voltage distribution among the positive threshold voltage distributions. It is verified whether a desired threshold voltage distribution has been obtained in the first memory cell or not (first write verify operation), moreover, it is verified whether a first threshold voltage distribution or a threshold voltage distribution having a voltage level larger than the first threshold-voltage distribution has been obtained in the second memory cell or not (second write verify operation). A control circuit outputs results of the first write verify operation and the second write verify operation.
申请公布号 US2014036600(A1) 申请公布日期 2014.02.06
申请号 US201314046477 申请日期 2013.10.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAGADOMI YASUSHI;TOKIWA NAOYA
分类号 G11C16/34 主分类号 G11C16/34
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