发明名称 PROBE CARD AND TESTING APPARATUS
摘要 <p>The present invention relates to a probe card for efficiently moving electronic components. According to the present invention, a probe card includes probes touching electrodes, a probe board including probes, a wiring plate facing the surface of a probe board in an opposite side including the probes, a connector including a connection pin electrically connected to the line of the probe board and the line of the wiring plate and a holder supporting a connection pin between the probe board and the wiring plate, and a first electronic component mounted on the probe board surface of the wiring plate and placed in a mounting space formed by a recess or a through hole provided by the holder.</p>
申请公布号 KR20140013943(A) 申请公布日期 2014.02.05
申请号 KR20130084542 申请日期 2013.07.18
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 MIKUNI KATSUSHI;KIKUCHI YOSHINORI;ONUMA YOSHIHITO;KUDO TOSHIYUKI
分类号 H01L21/66;G01R1/073 主分类号 H01L21/66
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