| 摘要 |
The invention relates to a method for measuring a wave by using a keying device that is guided along the longitudinal axis of the wave. According to the invention, the path along the longitudinal axis of which the keying device is guided is first of all intended to be measured for any deviations in the linearity and the parallelism relative to the longitudinal axis of the wave to be measured, and the data are intended to be stored on the basis of spatial coordinates. Data from the surface contour of the wave, namely the diameter of the wave, any eccentricity in the wave relative to the axis of rotation and the parallelism of the wave, and from the longitudinal-axis linearity of the surface relative to the axis of rotation are captured and stored. |
