发明名称
摘要 PROBLEM TO BE SOLVED: To provide a wiring board in which a probe for electrical inspection can be properly contacted to a semiconductor element connection pad, an electrode of a semiconductor element can be properly connected to the semiconductor element connection pad, and a wiring conductor tightly fits to a resin layer for protection, with both of them effectively prevented from peeling from each other. SOLUTION: In the wiring board, a wiring conductor 3 containing a plurality of semiconductor element connection pads 6 is embedded into the upper surface of an insulation substrate 1, and a resin layer 4 for exposing the semiconductor element connection pad 6 and an insulation substrate 1 arranged therearound is coated on the upper surface on the insulation substrate 1 and on the wiring conductor 3. The wiring conductor 3 is coated on the surface of the insulation substrate 1 side of the resin layer 4 by a semi-additive method. A part of the resin layer 4 and an insulating layer 2 arranged thereunder are removed down to a position lower than the upper surface of the semiconductor element connection pad 6, so that the semiconductor element connection pad 6 and the insulation substrate 1 arranged therearound are exposed. COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP5409519(B2) 申请公布日期 2014.02.05
申请号 JP20100124339 申请日期 2010.05.31
申请人 发明人
分类号 H05K3/46 主分类号 H05K3/46
代理机构 代理人
主权项
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