发明名称 Semiconductor device and method of manufacturing a semiconductor device
摘要 A semiconductor device and a method of manufacturing a gate stack for such a semiconductor device. The device includes a gate stack that has a gate insulation layer provided over a channel region of the device, and a metal layer that is insulated from the channel region by the gate insulation layer. The metal layer contains work function modulating impurities which have a concentration profile that varies along a length of the metal layer from the source region to the drain region. The gate stack has a first effective work function in the vicinity of a source region and/or the drain region of the device and a second, different effective work function toward a center of the channel region.
申请公布号 US8643121(B2) 申请公布日期 2014.02.04
申请号 US200913143762 申请日期 2009.11.23
申请人 MUELLER MARKUS;SINGANAMALLA RAGHUNATH;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 MUELLER MARKUS;SINGANAMALLA RAGHUNATH
分类号 H01L21/70 主分类号 H01L21/70
代理机构 代理人
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