发明名称 Method of manufacturing a semiconductor device
摘要 In the semiconductor device composing MOS transistor on which impurities are added from the surface of a P-type substrate, the region of immediate below a gate, layer is the P-type substrate on which the impurities are not added, and first and second MOS devices, having an N-type diffusion layer are provided on the surface region of the P-type substrate circumscribing the gate layer. The gate layer of the first MOS device, and the N-type diffusion layer of the second MOS device are connected, and the N-type diffusion layer of the first MOS device and the gate layer of the second MOS device are connected, and thereby a first capacitive element is composed.
申请公布号 US8642422(B2) 申请公布日期 2014.02.04
申请号 US201113315060 申请日期 2011.12.08
申请人 SHIMBAYASHI KOJI;SPANSION LLC 发明人 SHIMBAYASHI KOJI
分类号 H01L21/8242 主分类号 H01L21/8242
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