发明名称 Measurement of thin-layered structures in X-ray computer tomography
摘要 A method for reconstructing an image includes receiving tomographic data representative of an image signal; deriving, from the image signal, a plurality of components; identifying a spatial location associated with maximum phase congruency of the components; incorporating, into an image, an edge at the spatial location; and providing an output representative of the image.
申请公布号 US8644574(B2) 申请公布日期 2014.02.04
申请号 US20070444188 申请日期 2007.10.03
申请人 ESTEPAR RAUL SAN JOSE;WASHKO GEORGE R.;SILVERMAN EDWIN K.;REILLY JOHN J.;KIKINIS RON;WESTIN CARL-FREDRIK;THE BRIGHAM AND WOMEN'S HOSPITAL, INC. 发明人 ESTEPAR RAUL SAN JOSE;WASHKO GEORGE R.;SILVERMAN EDWIN K.;REILLY JOHN J.;KIKINIS RON;WESTIN CARL-FREDRIK
分类号 G06K9/36 主分类号 G06K9/36
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