发明名称 |
Measurement of thin-layered structures in X-ray computer tomography |
摘要 |
A method for reconstructing an image includes receiving tomographic data representative of an image signal; deriving, from the image signal, a plurality of components; identifying a spatial location associated with maximum phase congruency of the components; incorporating, into an image, an edge at the spatial location; and providing an output representative of the image. |
申请公布号 |
US8644574(B2) |
申请公布日期 |
2014.02.04 |
申请号 |
US20070444188 |
申请日期 |
2007.10.03 |
申请人 |
ESTEPAR RAUL SAN JOSE;WASHKO GEORGE R.;SILVERMAN EDWIN K.;REILLY JOHN J.;KIKINIS RON;WESTIN CARL-FREDRIK;THE BRIGHAM AND WOMEN'S HOSPITAL, INC. |
发明人 |
ESTEPAR RAUL SAN JOSE;WASHKO GEORGE R.;SILVERMAN EDWIN K.;REILLY JOHN J.;KIKINIS RON;WESTIN CARL-FREDRIK |
分类号 |
G06K9/36 |
主分类号 |
G06K9/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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