| 摘要 |
PROBLEM TO BE SOLVED: To provide a power cycle testing device capable of efficiently reproducing a stress close to a failure mode under an actual environment, and evaluating a power semiconductor element with high reliability.SOLUTION: The power cycle testing device is configured to apply stress currents to a power semiconductor element for testing in a predetermined ON/OFF cycle to give a thermal stress, and to perform the power cycle test of the power semiconductor element for testing includes: a function for executing a thermal cycle test in a temperature increase/decrease cycle which is longer than the above mentioned cycle by using means for changing an external environment temperature and a function for executing the power cycle test in accordance with the execution phase of the thermal cycle test while executing the thermal cycle test. |
