发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam device which, in a relatively simple configuration, corrects off-axis chromatic aberration and deflection coma aberration at the same time.SOLUTION: The present invention is a charged particle beam device provided with a tilting purpose deflector 08 disposed between a charged particle source 01 and an objective lens 09 and used to tilt a charged particle beam, the charged particle beam device having a first optical element 07 including an electromagnetic quadrupole which generates dispersion to suppress the dispersion caused by deflection by the tilting purpose deflector 08 and provided with a second optical element comprising the deflector 06 for deflecting the charged particle beam incident upon the first optical element 07 or an electromagnetic quadrupole which causes dispersion different from the dispersion generated by the first optical element to occur in the charged particle beam.
申请公布号 JP2014022297(A) 申请公布日期 2014.02.03
申请号 JP20120162258 申请日期 2012.07.23
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 DOI HIDETO;IKEGAMI AKIRA;KAZUMI HIDEYUKI
分类号 H01J37/153;H01J37/147;H01J37/28 主分类号 H01J37/153
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