发明名称 NONVOLATILE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor device capable of testing memory cells in a region where key codes are stored without causing the key codes to be read.SOLUTION: A nonvolatile semiconductor device 10 includes: a key code storage block 13 that includes a key code storage region 14 where key codes are stored; and an indicator bit storage region 15 that stores data indicating whether or not access to the key code storage block 13 is granted. The rewriting of the indicator bit storage region 15 which is granted access to the key code storage block 13 is performed by erasing the data in the indicator bit storage region 15. When the data in the indicator bit storage region 15 is erased, the key codes are also erased.
申请公布号 JP2014021992(A) 申请公布日期 2014.02.03
申请号 JP20120156417 申请日期 2012.07.12
申请人 SAMSUNG R&D INSTITUTE JAPAN CO LTD 发明人 SHIMADA TOSHIKI
分类号 G11C16/02;G06F21/60;G11C29/12;G11C29/56 主分类号 G11C16/02
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