发明名称 |
INSPECTION AND REPAIR METHOD FOR LCD PANEL |
摘要 |
The present invention relates to a method for inspecting and repairing a substrate, wherein the method is for inspecting a defective position through a pattern inspection on the substrate, determining whether or not a short circuit or disconnection is in the defective position through image comparison, and then outputting a signal for restoration corresponding to the short circuit or the disconnection in order to automatically restore a defective area. The method for inspecting and repairing the substrate comprises: an inspecting step of optically inspecting a pattern defect on the substrate, and then transmitting information in which the pattern defect is recorded; a deciphering step of determining whether or not the short circuit or the disconnection is in the pattern defect based on the transmitted information for the pattern defect; and a restoring step of recognizing the short circuit or the disconnection in the pattern defect, and then repairing the pattern defect. [Reference numerals] (S100) Inspecting step; (S200) Deciphering step; (S300) Restoring step; (S400) Re-inspecting step |
申请公布号 |
KR20140012340(A) |
申请公布日期 |
2014.02.03 |
申请号 |
KR20120078931 |
申请日期 |
2012.07.19 |
申请人 |
INTEKPLUS CO., LTD. |
发明人 |
LIM, SSANG GUN;KANG, MIN GU;SONG, JUN HO;LEE, HYUN MIN;HAN, CHUL HEE |
分类号 |
G01N21/88;G02F1/13 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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