发明名称 INSPECTION AND REPAIR METHOD FOR LCD PANEL
摘要 The present invention relates to a method for inspecting and repairing a substrate, wherein the method is for inspecting a defective position through a pattern inspection on the substrate, determining whether or not a short circuit or disconnection is in the defective position through image comparison, and then outputting a signal for restoration corresponding to the short circuit or the disconnection in order to automatically restore a defective area. The method for inspecting and repairing the substrate comprises: an inspecting step of optically inspecting a pattern defect on the substrate, and then transmitting information in which the pattern defect is recorded; a deciphering step of determining whether or not the short circuit or the disconnection is in the pattern defect based on the transmitted information for the pattern defect; and a restoring step of recognizing the short circuit or the disconnection in the pattern defect, and then repairing the pattern defect. [Reference numerals] (S100) Inspecting step; (S200) Deciphering step; (S300) Restoring step; (S400) Re-inspecting step
申请公布号 KR20140012340(A) 申请公布日期 2014.02.03
申请号 KR20120078931 申请日期 2012.07.19
申请人 INTEKPLUS CO., LTD. 发明人 LIM, SSANG GUN;KANG, MIN GU;SONG, JUN HO;LEE, HYUN MIN;HAN, CHUL HEE
分类号 G01N21/88;G02F1/13 主分类号 G01N21/88
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