| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe capable of smoothly inspecting a device while ensuring a good conductivity, and a semiconductor element socket including the same.SOLUTION: A contact probe 11 includes: an upper plunger 12 having a contact shaft 22; a lower plunger 13 having an insertion hole 32 which can be contacted by the contact shaft 22; and a coil spring 14 that is connected to the upper plunger 12 and the lower plunger 13 so as to cover the contact shaft 22. The coil spring 14 is constituted by spirally winding a wire 14a; and has a guide part 34, where the wire 14a is brought into close contact in an axial direction of the coil spring 14, in a part on the side of the lower plunger 13, including an area from an upper end of the insertion hole 32 to a part of an area on the side of the upper plunger 12. |
