发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit that reduces the number of elements of a circuit for removing a glitch occurring in a combinational logic circuit for generating a large number of output signals from a small number of input signals.SOLUTION: In the semiconductor integrated circuit, a decoding circuit 1 receives four input signals MODE0-MODE3 and outputs sixteen output signals OP0-OP15 more than the input signals. Four edge detection circuits 2-1 to 2-4 detect edges of signal level changes of the four input signals MODE0-MODE3, respectively, and output edge detection signals EG, respectively, after the lapse of a predetermined time set longer than the duration of a glitch occurring in the sixteen output signals OP0-OP15. The outputs EG0-EG3 of the fourth edge detection circuits are input into an OR circuit 3 (NOR gate), and in response to a latch signal that is an output of the OR circuit 3, sixteen data holding circuits FF0-FF15 latch the sixteen output signals OP0-OP15.
申请公布号 JP2014022914(A) 申请公布日期 2014.02.03
申请号 JP20120159414 申请日期 2012.07.18
申请人 TOSHIBA CORP 发明人 FUJIOKA HIROYUKI;OIGAWA ISAO;MORIYASU NORIYUKI;FURUSAWA TOSHIYUKI;FUKUDA SATOKO;SAWADA EIJI;TANAKA SETSUO;NAKANISHI YUYA
分类号 H03K5/00 主分类号 H03K5/00
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