| 摘要 |
<p>(Task) The objectives of the present invention are to improve yield rate, reduce manufacturing costs, and enhance productivity significantly by using the determination conditions of each user. (Method of solution) A defect inspection device (10) for inspecting defects in a sheet product including an optical film which is a component of an optical display device includes: a defect detection unit which detects defects in a single-layer body and/or a multi-layer stack which makes up a sheet product while a protective layer is not formed on the surface of the sheet product; and a defect data generation unit which generates defect data which is about the defects detected by the defect detection unit. The defect data is used in manufacturing a single wafer sheet product. [Reference numerals] (10) Defect inspection device; (11) Polarizer inspection unit; (12) Polarizing plate inspection unit; (13) Separator inspection unit; (14) Protection film inspection unit; (15) Defect data generationi unit; (16,22,42) Storage unit; (17,34) Defect data formation unit; (18,26,46) Display control unit; (19,27) Abnormality determination unit; (20) First inspection data processing device; (21,31,41,51) Acquisition unit; (23,43) Yield rate calculation unit; (24,44) Disk setting unit; (25,45) Input registration unit; (30) Slit cutting device; (32,52) Defect data reading unit; (33,53) Cutting unit; (40) Second inspection data processing device; (47) Cutting position data generation unit; (50) Single wafer cutting device; (54) Product data formation unit</p> |
