发明名称 NONVOLATILE STORAGE DEVICE AND INSPECTION METHOD FOR NONVOLATILE STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile storage device, etc., which are able to eliminate the step of deleting a value, written for inspection, by means of ultraviolet irradiation without making a structure special, and able to restrict manufacturing cost.SOLUTION: A nonvolatile storage memory comprises: a memory cell MC containing a floating gate FG; a coupling capacitance part FC; and a control line CL connected to the floating gate via the coupling capacitance part, and able to apply a predetermined potential to the memory cell. In a case where writing is carried out to the memory cell under a second condition in which an amount of charges injected into the floating gate is smaller than that in writing under a first condition, a first value is output in the first reading operation in which a first potential is applied to the control line whereas a second value is output in a second reading operation in which a second potential is applied to the control line.
申请公布号 JP2014021994(A) 申请公布日期 2014.02.03
申请号 JP20120156736 申请日期 2012.07.12
申请人 SEIKO EPSON CORP 发明人 TOKUDA YASUNOBU
分类号 G11C16/06;G11C16/02;G11C17/12;G11C29/12;H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C16/06
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