发明名称 CORNER LAYOUT FOR HIGH VOLTAGE SEMICONDUCTOR DEVICES
摘要 A corner layout for a semiconductor device that maximizes the breakdown voltage is disclosed. The device includes first and second subsets of the striped cell arrays. The ends of each striped cell in the first array is spaced a uniform distance from the nearest termination device structure. In the second subset, the ends of striped cells proximate a corner of the active cell region are configured to maximize breakdown voltage by spacing the ends of each striped cell a non-uniform distance from the nearest termination device structure. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
申请公布号 US2014027819(A1) 申请公布日期 2014.01.30
申请号 US201213561500 申请日期 2012.07.30
申请人 GUAN LINGPENG;BHALLA ANUP;ALPHA AND OMEGA SEMICONDUCTOR INCORPORATED 发明人 GUAN LINGPENG;BHALLA ANUP
分类号 H01L27/04;H01L21/20 主分类号 H01L27/04
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