发明名称 Semiconductor substrate cutting method and method of manufacturing a semiconductor device
摘要 <p>A semiconductor substrate cutting method which can efficiently cut a semiconductor substrate having a front face formed with a functional device together with a die bonding resin layer is provided. A wafer 11 having a front face 3 formed with a functional device 15 is irradiated with laser light L while positioning a light-converging point P within the wafer 11 with the rear face 17 of the wafer 11 acting as a laser light incident face, so as to generate multiphoton absorption, thereby forming a starting point region for cutting 8 due to a molten processed region 13 within the wafer 11 along a line along which the substrate should be cut 5. Consequently, a fracture can be generated from the starting point region for cutting 8 naturally or with a relatively small force, so as to reach the front face 3 and rear face 17. Therefore, when an expansion film 21 is attached to the rear face 17 of the wafer 11 by way of a die bonding resin layer 23 after forming the starting point region for cutting 8 and then expanded, the wafer 11 and die bonding resin layer 23 can be cut along the line along which the substrate should be cut 5.</p>
申请公布号 IL216690(A) 申请公布日期 2014.01.30
申请号 IL20110216690 申请日期 2011.11.30
申请人 HAMAMATSU PHOTONICS K.K.;FUMITSUGU FUKUYO;KENSHI FUKUMITSU;NAOKI UCHIYAMA;RYUJI SUGIURA;KAZUHIRO ATSUMI 发明人 FUMITSUGU FUKUYO;KENSHI FUKUMITSU;NAOKI UCHIYAMA;RYUJI SUGIURA;KAZUHIRO ATSUMI
分类号 B23K;H01L21/301;B23K26/08;B23K26/10;B23K26/40;H01L 主分类号 B23K
代理机构 代理人
主权项
地址