发明名称 SUBSTRATE CONTAMINATION RECOVERY METHOD, SUBSTRATE CONTAMINATION RECOVERY APPARATUS, AND SUBSTRATE CONTAMINATION RECOVERY ANALYSIS SYSTEM
摘要 PROBLEM TO BE SOLVED: To unfailingly recover only a contamination metal adhering to a peripheral part of a substrate and accurately analyze the contamination metal adhering to the peripheral part of the substrate.SOLUTION: A liquid is supplied only to a peripheral part of a substrate W1. Droplets contact with the peripheral part of the substrate W1. This process causes a contamination metal adhering to the peripheral part of the substrate W1 to be taken in the droplets. Then, the droplets contacting with the peripheral part of the substrate W1 are cooled to be freezed. This process changes the droplets contacting with the peripheral part of the substrate W1 to an ice block. The ice block taking in the metal contamination is peeled from the substrate W1 to be analyzed by an analyzer.
申请公布号 JP2014017280(A) 申请公布日期 2014.01.30
申请号 JP20120151559 申请日期 2012.07.05
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 HIRASHITA TOMOMI
分类号 H01L21/304 主分类号 H01L21/304
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