| 摘要 |
A semiconductor device includes an internal voltage generation unit configured to generate an internal voltage in response to an enable signal, an enable setting logic unit configured to define a starting time point for generating the internal voltage in response to the enable signal, a monitoring unit configured to monitor whether or not the internal voltage reaches a target level, and define an ending time point for generating the internal voltage in response to the monitoring result, and a measurement result signal generation unit configured to generate a measurement result signal corresponding to a developing time of the internal voltage in response to an output signal of the enable setting logic unit and an output signal of the monitoring unit. |
