| 摘要 |
According to one embodiment of the present invention, a semiconductor device (20) includes a semiconductor chip (200), which has formed therein functional blocks (201, 202, 203, and the like), and a temperature sensor (208). In the one embodiment of the present invention, corresponding to a change of the operating state of the semiconductor device (20), an on-chip temperature sensor (208) operates to perform switching from continuous operations of continuously measuring a chip temperature to intermittent operations of intermittently measuring the chip temperature, or to change time intervals at which the chip temperature is intermittently measured. |
