Diode testing device, particularly for examining power supply of direct current loads, has switching matrix for switching power supply diodes by pole of direct current load in locked state, and for connecting with measuring circuit

摘要

The diode testing device (1) has a switching matrix (5) for switching the power supply diodes (2,3) by a pole (6,7) of a direct current (DC) load (4) in a locked state, and for electrically connecting with a measuring circuit (8). The measuring circuit is provided for examining the blocking function of the power supply diode electrically connected with the measuring circuit by switching matrix. A microcontroller unit (9) is provided for evaluating the measurement of the measuring circuit and for partial automatic examination of the power supply (17) of the DC loads by the power supply diodes. An independent claim is included for a method for checking the power supply of the direct current loads from the power supply diodes through the diode testing device.