发明名称 MOUNTING DEVICE AND MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a mounding device capable of performing measurement adjustment for obtaining a preferred mounting result even in mounting a large-sized chip.SOLUTION: A contact pin is buried in a surface of a substrate stage. A mounting part is lowered so that a nozzle suction surface is brought into contact with a tip of the contact pin, and a relative movement amount between the mounting part and a mounting unit in such a case is determined. A degree of parallelization between the substrate stage and the nozzle suction surface can be numerically obtained by determining the relative movement amount at a plurality points within the nozzle suction surface.
申请公布号 JP2014017328(A) 申请公布日期 2014.01.30
申请号 JP20120152845 申请日期 2012.07.06
申请人 TDK CORP 发明人 MIZUNO TORU;SAITO YUJI;OTOMO TATSUNORI;MIYAKOSHI TOSHINOBU
分类号 H05K13/04;H01L21/52;H01L21/60 主分类号 H05K13/04
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