发明名称 |
MOUNTING DEVICE AND MEASURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a mounding device capable of performing measurement adjustment for obtaining a preferred mounting result even in mounting a large-sized chip.SOLUTION: A contact pin is buried in a surface of a substrate stage. A mounting part is lowered so that a nozzle suction surface is brought into contact with a tip of the contact pin, and a relative movement amount between the mounting part and a mounting unit in such a case is determined. A degree of parallelization between the substrate stage and the nozzle suction surface can be numerically obtained by determining the relative movement amount at a plurality points within the nozzle suction surface. |
申请公布号 |
JP2014017328(A) |
申请公布日期 |
2014.01.30 |
申请号 |
JP20120152845 |
申请日期 |
2012.07.06 |
申请人 |
TDK CORP |
发明人 |
MIZUNO TORU;SAITO YUJI;OTOMO TATSUNORI;MIYAKOSHI TOSHINOBU |
分类号 |
H05K13/04;H01L21/52;H01L21/60 |
主分类号 |
H05K13/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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