发明名称 MASK BLANK, TRANSFER MASK, METHOD OF MANUFACTURING A TRANSFER MASK, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A mask blank for use in the manufacture of a transfer mask adapted to be applied with ArF excimer laser exposure light is disclosed. The mask blank has, on a transparent substrate, a light-shielding film for forming a transfer pattern. The light-shielding film has an at least two-layer structure including a lower layer and an upper layer from the transparent substrate side. The lower layer is made of a material composed of a transition metal, silicon, and nitrogen and having a nitrogen content of 21 at % or more and a refractive index n of 1.9 or less. The upper layer is made of a material composed of a transition metal, silicon, and nitrogen and having a refractive index n of 2.1 or less. A surface layer of the upper layer contains oxygen and has a nitrogen content of 14 at % or more.
申请公布号 US2014030641(A1) 申请公布日期 2014.01.30
申请号 US201314042765 申请日期 2013.10.01
申请人 HOYA CORPORATION 发明人 KOMINATO ATSUSHI;HASHIMOTO MASAHIRO;IWASHITA HIROYUKI
分类号 G03F1/50;G03F1/00;G03F1/74;G03F7/20 主分类号 G03F1/50
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