发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To reduce an impurity amount in a film in formation of a metal compound film by atom layer deposition (ALD).SOLUTION: In formation of a metal compound film by atomic layer deposition, which includes a step of making a metal material adsorb onto a base by supplying a metal material gas, a step of purging the metal material gas in a deposition space, a step of supplying a reaction gas to modify the metal material into a metal compound and a step of purging the reaction gas as one cycle, a uniform atomic layer is formed in the first cycle by setting a supply time of the metal material gas in the first cycle longer than a supply time in each of the second and the following cycles.
申请公布号 JP2014017461(A) 申请公布日期 2014.01.30
申请号 JP20120222886 申请日期 2012.10.05
申请人 PS4 LUXCO S A R L 发明人 FUJIWARA NAONORI
分类号 H01L21/316;C23C16/40;C23C16/455;H01L21/8242;H01L27/108 主分类号 H01L21/316
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