发明名称 NON-LITHOGRAPHIC LINE PATTERN FORMATION
摘要 A metal layer is deposited over an underlying material layer. The metal layer includes an elemental metal that can be converted into a dielectric metal-containing compound by plasma oxidation and/or nitridation. A hard mask portion is formed over the metal layer. Plasma oxidation or nitridation is performed to convert physically exposed surfaces of the metal layer into the dielectric metal-containing compound. The sequence of a surface pull back of the hard mask portion, trench etching, another surface pull back, and conversion of top surfaces into the dielectric metal-containing compound are repeated to form a line pattern having a spacing that is not limited by lithographic minimum dimensions.
申请公布号 US2014027917(A1) 申请公布日期 2014.01.30
申请号 US201213561122 申请日期 2012.07.30
申请人 TSENG CHIAHSUN;HORAK DAVID V.;YEH CHUN-CHEN;YIN YUNPENG;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 TSENG CHIAHSUN;HORAK DAVID V.;YEH CHUN-CHEN;YIN YUNPENG
分类号 H01L21/308;H01L23/48 主分类号 H01L21/308
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