发明名称 Semiconductor Device Including a Dielectric Structure in a Trench
摘要 A semiconductor device includes a trench extending into a drift zone of a semiconductor body from a first surface. The semiconductor device further includes a gate electrode in the trench and a body region adjoining a sidewall of the trench. The semiconductor device further includes a dielectric structure in the trench. The dielectric structure includes a high-k dielectric in a lower part of the trench. The high-k dielectric includes a dielectric constant higher than that of SiO2. An extension of the high-k dielectric in a vertical direction perpendicular to the first surface is limited between a bottom side of the trench and a level where a bottom side of the body region adjoins the sidewall of the trench.
申请公布号 US2014027812(A1) 申请公布日期 2014.01.30
申请号 US201213556335 申请日期 2012.07.24
申请人 SCHULZE HANS-JOACHIM;HIRLER FRANZ;FELSL HANS-PETER;NIEDERNOSTHEIDE FRANZ-JOSEF;INFINEON TECHNOLOGIES AG 发明人 SCHULZE HANS-JOACHIM;HIRLER FRANZ;FELSL HANS-PETER;NIEDERNOSTHEIDE FRANZ-JOSEF
分类号 H01L29/78;H01L29/739 主分类号 H01L29/78
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