发明名称 FIN-FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a fin-field effect transistor and a manufacturing method of the same.SOLUTION: A manufacturing method of a finFET comprises: a step of forming first and second fins of a finFET, which extend upward from a semiconductor substrate and shallow trench isolation (STI) regions between the first and second fins by forming a distance between a top face of the STI regions and each top face of the first and second fins; a step of providing first and second fin extension parts on the top faces and lateral faces of the first and second fins above the top face of the STI region, respectively; a step of removing a material from the STI regions to increase a distance between the top face of the STI regions and each top face of the first and second fins; a step of accumulating a conformal stressor dielectric material on the fins and the STI regions; and a step of reflowing the conformal stressor dielectric material in such a manner as to flow from the top face of the STI regions into between the first and second fins thereby to apply stress to a channel of the finFET.
申请公布号 JP2014017515(A) 申请公布日期 2014.01.30
申请号 JP20130201824 申请日期 2013.09.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTUARING CO LTD 发明人 LIN CHIA-PIN;CHAN CHIEN-TAI;LIN HSIEN-CHIN;LIN SHYUE-SHYH
分类号 H01L21/8234;H01L21/336;H01L27/088;H01L29/78 主分类号 H01L21/8234
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