发明名称 ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE
摘要 <p>An objective of the present invention is to provide an electron microscope and an electron microscope sample retaining device whereby it is possible to easily and safely produce either a gas or liquid environment within an electron microscope, and to observe a sample therewithin and a reaction thereof at high resolution. An electron microscope comprises a sample retaining means (6) for retaining a sample (23). The sample (23) is positioned within a capillary (17) wherethrough it is possible for an electron beam to pass. The electron microscope further comprises: a supply device wherein which supplies either a gas or a liquid within the capillary (17); and a recovery device which recovers the gas or liquid. The electron microscope acquires a sample image of the sample while streaming the gas or liquid.</p>
申请公布号 WO2014017225(A1) 申请公布日期 2014.01.30
申请号 WO2013JP66776 申请日期 2013.06.19
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 YAGUCHI TOSHIE;NAGAKUBO YASUHIRA
分类号 H01J37/20;H01J37/26 主分类号 H01J37/20
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