发明名称 |
ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE |
摘要 |
<p>An objective of the present invention is to provide an electron microscope and an electron microscope sample retaining device whereby it is possible to easily and safely produce either a gas or liquid environment within an electron microscope, and to observe a sample therewithin and a reaction thereof at high resolution. An electron microscope comprises a sample retaining means (6) for retaining a sample (23). The sample (23) is positioned within a capillary (17) wherethrough it is possible for an electron beam to pass. The electron microscope further comprises: a supply device wherein which supplies either a gas or a liquid within the capillary (17); and a recovery device which recovers the gas or liquid. The electron microscope acquires a sample image of the sample while streaming the gas or liquid.</p> |
申请公布号 |
WO2014017225(A1) |
申请公布日期 |
2014.01.30 |
申请号 |
WO2013JP66776 |
申请日期 |
2013.06.19 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
YAGUCHI TOSHIE;NAGAKUBO YASUHIRA |
分类号 |
H01J37/20;H01J37/26 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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