发明名称 SELF-ALIGNED SEMICONDUCTOR TRENCH STRUCTURES
摘要 Methods for forming a semiconductor device include forming self-aligned trenches, in which a first set of trenches is used to align a second set of trenches. Methods taught herein can be used as a pitch doubling technique, and may therefore enhance device integration. Further, employing a very thin CMP stop layer, and recessing surrounding materials by about an equal amount to the thickness of the CMP stop layer, provides improved planarity at the surface of the device.
申请公布号 US2014030869(A1) 申请公布日期 2014.01.30
申请号 US201314038365 申请日期 2013.09.26
申请人 MICRON TECHNOLOGY, INC. 发明人 WERNER JUENGLING;LANE RICHARD
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
主权项
地址