发明名称
摘要 PROBLEM TO BE SOLVED: To provide a magnetic particle inspection device by a simple structure at a low cost, capable of obtaining a high magnetic particle inspection accuracy on the entire surfaces of an X-Y plane, a Y-Z plane, and a Z-X plane. SOLUTION: A magnetization device for an inspection object comprises: a tripolar yoke type magnetizer 10 in which three magnetization elements are arranged at a phase difference of 120 degrees to each other and the electric wires of the three magnetization elements are Δ-connected or Y-connected; a bipolar yoke type magnetizer 20 facing a magnetization region 1 in a direction different from the direction of the tripolar yoke type magnetizer 10, and an electric power supply 100 applying a three-phase AC power to the tripolar yoke type magnetizer 10 and applying an AC voltage to the bipolar yoke type magnetizer 20. In an X-Y plane, a rotating magnetic field C is generated by the tripolar yoke type magnetizer 10. Also in a Y-Z plane and a Z-X plane, rotating magnetic fields are formed by a composition vector of a magnetic field D in a z-axis direction formed by the bipolar yoke type magnetizer 20 and a magnetic field C formed in the X-Y plane by the tripolar yoke type magnetizer 10. COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5403828(B2) 申请公布日期 2014.01.29
申请号 JP20110061993 申请日期 2011.03.22
申请人 发明人
分类号 G01N27/84 主分类号 G01N27/84
代理机构 代理人
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