发明名称 |
HYBRID INTERCONNECT SCHEME AND METHODS FOR FORMING THE SAME |
摘要 |
A device includes a first low-k dielectric layer and a Cu-containing via in the low-k dielectric layer. The device further includes a low-k dielectric layer on the first low-k dielectric layer and an Al-containing metal line on the Cu-containing via electrically connected to the Cu-containing via. The Al-containing metal line is in the second low-k dielectric layer. |
申请公布号 |
KR20140011908(A) |
申请公布日期 |
2014.01.29 |
申请号 |
KR20120153151 |
申请日期 |
2012.12.26 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
YU CHEN HUA;BAO TIEN I |
分类号 |
H01L21/28;H01L21/768 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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