发明名称 HYBRID INTERCONNECT SCHEME AND METHODS FOR FORMING THE SAME
摘要 A device includes a first low-k dielectric layer and a Cu-containing via in the low-k dielectric layer. The device further includes a low-k dielectric layer on the first low-k dielectric layer and an Al-containing metal line on the Cu-containing via electrically connected to the Cu-containing via. The Al-containing metal line is in the second low-k dielectric layer.
申请公布号 KR20140011908(A) 申请公布日期 2014.01.29
申请号 KR20120153151 申请日期 2012.12.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 YU CHEN HUA;BAO TIEN I
分类号 H01L21/28;H01L21/768 主分类号 H01L21/28
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