发明名称 RESIST UNDERLAYER FILM FORMATION COMPOSITION AND METHOD FOR FORMING RESIST PATTERN USING SAME
摘要 <p>A resist underlayer film forming composition for lithography, includes: a polymer including a structure of formula (1) below at a terminal of a polymer chain; a cross-linking agent; a compound that promotes a cross-linking reaction; and an organic solvent: (where R1, R2, and R3 are each independently a hydrogen atom, a linear or branched hydrocarbon group having a carbon atom number of 1 to 13, or a hydroxy group; at least one of R1, R2, and R3 is the hydrocarbon group; m and n are each independently 0 or 1; and a main chain of the polymer is bonded to a methylene group when n is 1 and bonded to a group represented by—O—when n is 0).</p>
申请公布号 KR20140012111(A) 申请公布日期 2014.01.29
申请号 KR20137025467 申请日期 2012.03.08
申请人 NISSAN CHEMICAL INDUSTRIES, LTD. 发明人 OHNISHI RYUJI;ENDO TAKAFUMI;SAKAMOTO RIKIMARU
分类号 G03F7/11;G03F7/26;H01L21/027 主分类号 G03F7/11
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