发明名称 Method for selective deposition of a semiconductor material
摘要 <p>A method for selective deposition of semiconductor materials in semiconductor processing includes providing a patterned substrate (10) comprising a first region (11) and a second region (12), where the first region (11) comprises an exposed first semiconductor material and the second region (12) comprise an exposed insulator material. The method further includes selectively providing a film of the second semiconductor material on the first semiconductor material of the first region by providing a precursor of a second semiconductor material, a carrier gas that is not reactive with Cl components, and tin-tetrachloride (SnCl 4 ). The tin-tetrachloride inhibits the deposition of the second semiconductor material on the insulator material of the second region.</p>
申请公布号 EP2477211(A3) 申请公布日期 2014.01.29
申请号 EP20120151255 申请日期 2012.01.16
申请人 IMEC 发明人 VINCENT, BENJAMIN;LOO, ROGER;CAYMAX, MATTY
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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