发明名称 |
Method for selective deposition of a semiconductor material |
摘要 |
<p>A method for selective deposition of semiconductor materials in semiconductor processing includes providing a patterned substrate (10) comprising a first region (11) and a second region (12), where the first region (11) comprises an exposed first semiconductor material and the second region (12) comprise an exposed insulator material. The method further includes selectively providing a film of the second semiconductor material on the first semiconductor material of the first region by providing a precursor of a second semiconductor material, a carrier gas that is not reactive with Cl components, and tin-tetrachloride (SnCl 4 ). The tin-tetrachloride inhibits the deposition of the second semiconductor material on the insulator material of the second region.</p> |
申请公布号 |
EP2477211(A3) |
申请公布日期 |
2014.01.29 |
申请号 |
EP20120151255 |
申请日期 |
2012.01.16 |
申请人 |
IMEC |
发明人 |
VINCENT, BENJAMIN;LOO, ROGER;CAYMAX, MATTY |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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