发明名称 System abnormalities
摘要 A monitor and method to identify an abnormality in a system (10), comprising a sensor (60) to measure a parameter value (84) of the system. A processor (64) to receive parameter values; select a subset to store in a buffer; and calculate a threshold (66) corresponding to normal values of the parameter. An estimator (80) to estimate the next parameter value. A comparator (68) to compare a measured parameter value to the calculated threshold and to store: the measured parameter value in the buffer if the measured parameter value does not exceed the calculated threshold and the estimated parameter value in the buffer if the measured parameter value exceeds the calculated threshold.
申请公布号 GB201322062(D0) 申请公布日期 2014.01.29
申请号 GB20130022062 申请日期 2013.12.13
申请人 OPTIMIZED SYSTEMS AND SOLUTIONS LIMITED 发明人
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