发明名称 Nonvolatile memory device and method for fabricating the same
摘要 A nonvolatile memory device includes a channel vertically extending from a substrate and comprising a first region that is doped with first impurities and a second region that is disposed under the first region, a plurality of memory cells and a selection transistor stacked over the substrate along the channel, and a diffusion barrier interposed between the first region and the second region, wherein a density of the first impurities is higher than a density of impurities of the second region.
申请公布号 US8637913(B2) 申请公布日期 2014.01.28
申请号 US201113304551 申请日期 2011.11.25
申请人 YOO HYUN-SEUNG;CHOI EUN-SEOK;HYNIX SEMICONDUCTOR INC. 发明人 YOO HYUN-SEUNG;CHOI EUN-SEOK
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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