| 摘要 |
By irradiating a sample with incoming light perpendicularly, it is possible to make the entire device more compact, while at the same time making it possible to measure the degree of anisptropy and the orientation of the optical axis and over an extremely short period of time. An optical system (4) is formed, in which incoming light from a laser (6) is made incident upon a sample (3) in a perpendicular direction, and reflected light reflected in a perpendicular direction is directed to a photoreceptor (9) via a half-mirror (7), a polarizer (P) is positioned between a laser (6) and the half-mirror (7), an analyzer (A) is positioned between the half-mirror (7) and the photoreceptor element (9), and a 1/2 wavelength plate (12) that rotates the linearly polarized light generated by the polarizer (P), and a 1/4 wavelength plate (13) that cyclically rotates the direction of the delay phase axis in such a manner that the angle of rotation with respect to the 1/2 wavelength plate (12) from the initial position staggered by ±d (d ?np/4, where n is an integer) with respect to the delay phase axis of the 1/2 wavelength plate is doubled, are positioned between the half mirror (7) and the sample (3). |
