| 发明名称 |
Transformer within wafer test probe |
| 摘要 |
A wafer test probe for testing integrated circuitry on a die is disclosed. The wafer test probe includes a membrane core. The wafer test probe also includes circuitry within the membrane core. The circuitry within the membrane core includes at least one portion of an inductor. The wafer test probe further includes a probe tip. |
| 申请公布号 |
US8638114(B2) |
申请公布日期 |
2014.01.28 |
| 申请号 |
US20090633661 |
申请日期 |
2009.12.08 |
| 申请人 |
JOSEFOSKY JOHN T;TANG YIWU;HAYWARD ROGER;QUALCOMM INCORPORATED |
发明人 |
JOSEFOSKY JOHN T;TANG YIWU;HAYWARD ROGER |
| 分类号 |
G01R1/067;G01R1/073;G01R31/00;G01R31/28 |
主分类号 |
G01R1/067 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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