发明名称 Semiconductor device and method of testing the same
摘要 There is provided a semiconductor device comprising, a first metal pattern formed at a first metal level and extending in a first direction, a second metal pattern formed at the first metal level, extending in a second direction that is different than the first direction, and disposed on a side of the first metal pattern to be separated from the first metal pattern, a first via structure formed on the first metal pattern, a third metal pattern formed at a second metal level that is different than the first metal level and electrically connected to the first metal pattern by the first via structure, and a first pad electrically connected to the first metal pattern and a second pad electrically connected to the third metal pattern.
申请公布号 US8637988(B2) 申请公布日期 2014.01.28
申请号 US201213525707 申请日期 2012.06.18
申请人 LEE JONG-HYUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JONG-HYUN
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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