| 摘要 |
The present invention relates to an apparatus for rotating a head unit of an LCD test equipment which can measure and test a pattern of an LCD glass more rapidly and precisely and also can reduce total size of the LCD test equipment according as a probe card touches the pattern of the LCD glass by rotating only a head unit combined to the probe card without rotating the LCD glass. For the above, an LCD test equipment of the present invention comprises a granite plate, a stage base, an LCD glass having a pattern, a linear motor, and a head unit combined with a probe card and an optical camera. The apparatus also comprises a rotation motor which is combined to the linear motor as being able to move and is combined to the head unit through an axis, and makes the probe card and the pattern of the LCD glass be in contact with each other by rotating only the head unit under the state of being fixed to the upper part of the granite plate, in order not to rotate the stage base and the LCD glass. |
