发明名称 Monitoring Method and Apparatus for Electron Energy Distribution Characteristics of Plasma
摘要 PURPOSE: A variation monitoring method of an electronic energy distribution property and an apparatus including the same are provided to shorten a calculation time by calculating an EEDF[Electron Energy Distribution Function]in a simple method by utilizing an OES[Optical Emission Spectroscopy]signal. CONSTITUTION: A mathematical modeling about a light intensity is established(S110). An EEDF is measured based on the established mathematical modeling(S120). A monitoring about a process plasma state is performed based on the variation of the measured EEDF(S130). [Reference numerals] (AA) Start; (BB) End; (S110) Establish mathematical modeling about light intensity; (S120) Measure an EEDF based on the mathematical modeling; (S130) Perform a monitoring about a process plasma state based on the variation of the EEDF
申请公布号 KR101354343(B1) 申请公布日期 2014.01.27
申请号 KR20110123540 申请日期 2011.11.24
申请人 发明人
分类号 C23C16/52;H01L21/205;H01L21/3065;H05H1/00 主分类号 C23C16/52
代理机构 代理人
主权项
地址