发明名称 Deflection Mirror and Projection Exposure Apparatus for Microlithography Comprising Such a Deflection Mirror
摘要 A deflection mirror (1, 501, etc.) for a microlithography projection exposure apparatus for illuminating an object field in an object plane of the projection exposure apparatus (1067) using the deflection mirror with grazing incidence. This deflection mirror has a substrate (3, 503, etc.) and at least one layer system (5, 505, etc.), and during operation light impinges on said mirror at a multiplicity of angles of incidence, wherein the layer system is designed such that, for light having a wavelength of less than 30 nm, for an angle of incidence of between 55° and 70°, the variation of the reflectivity is less than 20%, in particular less than 12%.
申请公布号 US2014022525(A1) 申请公布日期 2014.01.23
申请号 US201314032724 申请日期 2013.09.20
申请人 CARL ZEISS SMT GMBH 发明人 ENKISCH HARTMUT;MUELLENDER STEPHAN;ENDRES MARTIN
分类号 G03F7/20;G02B17/06 主分类号 G03F7/20
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