发明名称 Measuring System
摘要 A measuring system for measuring signal characteristics on a node is disclosed. The measuring system includes a contact measuring unit including a probe for contacting the node to fetch a signal on the node, an output interface, a plurality of capacitors coupled between the probe and the output interface where a capacitance of each capacitor corresponds to a frequency range, and a protection circuit, of which one terminal coupled between the probe and the output interface and the other terminal coupled to a ground terminal, and a frequency analyzer coupled to the output interface for displaying information of amplitude vs. frequency of a signal outputted from the output interface to measure the signal characteristic on the node.
申请公布号 US2014021964(A1) 申请公布日期 2014.01.23
申请号 US201313792240 申请日期 2013.03.11
申请人 WISTRON CORPORATION 发明人 CHANG HUNG-KAI;SU CHUNG-YAW;CHANG CHIU-HSIEN
分类号 G01R29/26 主分类号 G01R29/26
代理机构 代理人
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