发明名称 INTERFACE ADHESION IMPROVEMENT METHOD
摘要 Embodiments of the invention provide methods of an interface adhesion improvement methods used on a transparent substrate for OLED or thin film transistor applications. In one embodiment, a method of forming a buffer layer on a surface of a substrate includes providing a substrate having an planarization material disposed thereon in a processing chamber, supplying a buffer layer gas mixture including a silicon containing gas into the processing chamber, controlling a substrate temperature less than about 100 degrees Celsius, forming a buffer layer on the planarization material, supplying an encapsulating barrier layer deposition gas mixture including a silicon containing gas and a nitrogen containing gas into the processing chamber, and forming an encapsulating barrier layer on the buffer layer.
申请公布号 US2014024180(A1) 申请公布日期 2014.01.23
申请号 US201313947032 申请日期 2013.07.20
申请人 CHOI YOUNG JIN;CHEN JRJYAN JERRY;PARK BEOM SOO;CHOI SOO YOUNG;APPLIED MATERIALS, INC. 发明人 CHOI YOUNG JIN;CHEN JRJYAN JERRY;PARK BEOM SOO;CHOI SOO YOUNG
分类号 H01L21/02 主分类号 H01L21/02
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