发明名称 SYSTEM AND METHOD FOR PROCESSING OBJECT
摘要 PROBLEM TO BE SOLVED: To provide a processing and a monitoring system capable of selectively performing accumulation and ablation using a reaction gas activated by a particle beam.SOLUTION: A system 1 comprises a particle beam column 26, an object holder 24, and a gas supply device 28. The object holder 24 comprises a base 20, a first table 21 which can move to the base 20, a second table 22 which can move to the first table 21, and a third table 23 which can rotate with respect to the second table 22. A canula 30 of the gas supply device 28 is fixed at the first table 21.
申请公布号 JP2014013762(A) 申请公布日期 2014.01.23
申请号 JP20130171069 申请日期 2013.08.21
申请人 CARL ZEISS MICROSCOPY GMBH 发明人 BUHLER WOLFRAM;ROSENTHAL ALEXANDER;BERTAGNOLLI EMMERICH;WANZENBOECK HEINZ;FISCHER MARKUS;HOCHLEITNER GOTTFRIED
分类号 H01J37/28;G03F1/00;H01J37/20;H01J37/317 主分类号 H01J37/28
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