发明名称 SLIT LAMP MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a slit lamp microscope that can favorably obtain a captured image of an eye.SOLUTION: A slit lamp microscope comprises: an illumination optical system having an illumination light source for illuminating an eye; an observation optical system for observing a subject eye illuminated by the illumination light source; an imaging optical system having an imaging element for imaging the eye illuminated by the illumination light source; a filter arranged insertably and removably in an optical path of the illumination optical system or the imaging optical system; a filter detection part for detecting a filter placed in the optical path; and gain adjustment means for adjusting, according to a filter detection signal provided by the filer detection part, a gain of a signal outputted from each pixel of the imaging element.
申请公布号 JP2014012036(A) 申请公布日期 2014.01.23
申请号 JP20120149697 申请日期 2012.07.03
申请人 NIDEK CO LTD 发明人 MAKINO KENICHIRO;OYABU KEIJI;NAKAMURA KOICHI
分类号 A61B3/12 主分类号 A61B3/12
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