发明名称 ARRAY FLAW DETECTION DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide an array flaw detection device and a method capable of highly accurately detecting a flaw such as a corrosion amount without being affected by the change of eco caused by a contact state between a probe and a test piece.SOLUTION: An array flaw detection device includes an array probe 6 disposed by arraying a plurality of elements driven by an electric signal to propagate an ultrasonic wave through a test piece and convert the ultrasonic wave propagated through the test piece into an electric signal, and a transceiver 7 for driving each element of the array probe, and receiving the electric signal from each element to detect an array flaw. The transceiver, after it receives the electric signal obtained at each element by driving each element of the array probe at desired timing, obtains the electric signal generated when an ultrasonic wave is propagated at a desired angle during transmission to generate a synthetic wave, obtains angle characteristics of amplitude of the synthetic wave with respect to the angle, and obtains the recessed amount of a recess present in the test piece from the angle where the amplitude changes relatively greatly.
申请公布号 JP2014013187(A) 申请公布日期 2014.01.23
申请号 JP20120150615 申请日期 2012.07.04
申请人 MITSUBISHI ELECTRIC CORP;RYODEN SHONAN ELECTRONICS KK;PUBLIC WORKS RESEARCH INSTITUTE 发明人 KIMURA TOMONORI;KOIKE MITSUHIRO;TAKAHASHI MINORU;MURAKOSHI JUN
分类号 G01N29/04;G01N29/24 主分类号 G01N29/04
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