发明名称 Semiconductor Device and Fabrication Method Thereof
摘要 A semiconductor device and a method for fabricating the semiconductor device are disclosed. An isolation structure is formed in a substrate and a gate stack is formed atop the isolation structure. A spacer is formed adjoining a sidewall of the gate stack and extends beyond an edge of the isolation structure. The disclosed method provides an improved method for protecting the isolation structure by using the spacer. The spacer can prevent the isolation structure from being damaged by chemicals, therefor, to enhance contact landing and upgrade the device performance.
申请公布号 US2014021517(A1) 申请公布日期 2014.01.23
申请号 US201213551107 申请日期 2012.07.17
申请人 CHENG CHUN-FAI;TSAI HAN-TING;CHANG AN-SHEN;LIN HUI-MIN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHENG CHUN-FAI;TSAI HAN-TING;CHANG AN-SHEN;LIN HUI-MIN
分类号 H01L29/772;H01L21/336 主分类号 H01L29/772
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